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casa
$Rev:20696$
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casa
$Rev:20696$
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Public Member Functions | |
| def | setUp |
| def | tearDown |
| def | test000 |
| def | test001 |
| def | test002 |
| def | test003 |
| def | test004 |
| def | test005 |
| def | test006 |
| def | test007 |
| def | test008 |
| def | test009 |
| def | test010 |
| def | test011 |
| def | test012 |
| def | test013 |
| def | test014 |
Static Public Attributes | |
| string | prefix |
| int | badid |
| outfile | |
Test on bad parameter setting
Definition at line 118 of file test_sdimaging.py.
| def tests.test_sdimaging.sdimaging_test0.setUp | ( | self | ) |
Definition at line 127 of file test_sdimaging.py.
References tests.test_plotuv.plotuv_test.datapath, tests.test_sdcoadd.sdcoadd_unittest_base.datapath, tests.test_sdbaseline.sdbaseline_unittest_base.datapath, tests.test_sdflagmanager.sdflagmanager_test.datapath, tests.test_sdgrid.sdgrid_unittest_base.datapath, tests.test_msmoments.msmoments_unittest_base.datapath, tests.test_sdflag.sdflag_test.datapath, tests.test_sdcal.sdcal_unittest_base.datapath, tests.test_imstat.imstat_test.datapath, tests.test_sdfit.sdfit_test.datapath, tests.test_cleanhelper.cleanhelper_test.datapath, tests.test_sdimaging.sdimaging_unittest_base.datapath, tests.test_imsmooth.imsmooth_test.datapath, tests.test_sdcoadd.sdcoadd_mergeTest.datapath, tests.test_sdfit.sdfit_test_exceptions.datapath, tests.test_sdbaseline.sdbaseline_funcTest.datapath, casa_in_py.default(), tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.tearDown | ( | self | ) |
Definition at line 134 of file test_sdimaging.py.
References tests.test_partition.test_base.prefix, tests.test_fluxscale.fluxscale1_test.prefix, tests.test_msmoments.msmoments_test0.prefix, tests.test_sdgrid.sdgrid_failure_case.prefix, tests.test_sdimaging.sdimaging_test0.prefix, tests.test_msmoments.msmoments_test1.prefix, tests.test_sdcal.sdcal_test0.prefix, tests.test_sdcal.sdcal_test1.prefix, tests.test_sdcal.sdcal_test2.prefix, tests.test_sdcal.sdcal_test3.prefix, tests.test_sdcal.sdcal_test4.prefix, tests.test_sdcal.sdcal_test5.prefix, tests.test_sdcal.sdcal_test6.prefix, tests.test_sdcal.sdcal_test7.prefix, tests.test_sdcal.sdcal_test8.prefix, tests.test_sdcal.sdcal_test9.prefix, tests.test_sdcal.sdcal_test_edgemarker_generic.prefix, tests.test_sdcal.sdcal_test_edgemarker_raster.prefix, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test000 | ( | self | ) |
Test 000: Default parameters
Definition at line 139 of file test_sdimaging.py.
| def tests.test_sdimaging.sdimaging_test0.test001 | ( | self | ) |
Test001: Bad specunit
Definition at line 145 of file test_sdimaging.py.
References asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test002 | ( | self | ) |
Test002: Bad field id
Definition at line 151 of file test_sdimaging.py.
References tests.test_sdgrid.sdgrid_failure_case.badid, tests.test_sdimaging.sdimaging_test0.badid, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.postfix, tests.test_sdcal.sdcal_caltest_base.postfix, tests.test_sdcal.sdcal_avetest_base.postfix, tests.test_partition.test_base.prefix, tests.test_fluxscale.fluxscale1_test.prefix, tests.test_msmoments.msmoments_test0.prefix, tests.test_sdgrid.sdgrid_failure_case.prefix, tests.test_sdimaging.sdimaging_test0.prefix, tests.test_msmoments.msmoments_test1.prefix, tests.test_sdcal.sdcal_test0.prefix, tests.test_sdcal.sdcal_test1.prefix, tests.test_sdcal.sdcal_test2.prefix, tests.test_sdcal.sdcal_test3.prefix, tests.test_sdcal.sdcal_test4.prefix, tests.test_sdcal.sdcal_test5.prefix, tests.test_sdcal.sdcal_test6.prefix, tests.test_sdcal.sdcal_test7.prefix, tests.test_sdcal.sdcal_test8.prefix, tests.test_sdcal.sdcal_test9.prefix, tests.test_sdcal.sdcal_test_edgemarker_generic.prefix, tests.test_sdcal.sdcal_test_edgemarker_raster.prefix, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test003 | ( | self | ) |
Test003: Bad spectral window id
Definition at line 163 of file test_sdimaging.py.
References tests.test_sdgrid.sdgrid_failure_case.badid, tests.test_sdimaging.sdimaging_test0.badid, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test004 | ( | self | ) |
Test004: Bad antenna id
Definition at line 174 of file test_sdimaging.py.
References tests.test_sdgrid.sdgrid_failure_case.badid, tests.test_sdimaging.sdimaging_test0.badid, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test005 | ( | self | ) |
Test005: Bad stokes parameter
Definition at line 180 of file test_sdimaging.py.
References asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test006 | ( | self | ) |
Test006: Bad gridfunction
Definition at line 191 of file test_sdimaging.py.
References asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test007 | ( | self | ) |
Test007: Bad scanlist
Definition at line 197 of file test_sdimaging.py.
References tests.test_sdgrid.sdgrid_failure_case.badid, tests.test_sdimaging.sdimaging_test0.badid, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test008 | ( | self | ) |
Test008: Existing outfile with overwrite=False
Definition at line 203 of file test_sdimaging.py.
References asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test009 | ( | self | ) |
Test009: Bad phasecenter string
Definition at line 217 of file test_sdimaging.py.
References parallel.parallel_cont.imagecont.cell, parallel.pimager.pimager.cell, tests.test_cleanhelper.cleanhelper_test.cell, tests.test_sdimaging.sdimaging_unittest_base.cell, parallel.pimager.pimager.imsize, tests.test_cleanhelper.cleanhelper_test.imsize, tests.test_sdimaging.sdimaging_unittest_base.imsize, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test010 | ( | self | ) |
Test010: Bad phasecenter reference (J2000 is assumed)
Definition at line 228 of file test_sdimaging.py.
References make_mmsdata.all, parallel.parallel_cont.imagecont.cell, parallel.pimager.pimager.cell, tests.test_cleanhelper.cleanhelper_test.cell, tests.test_sdimaging.sdimaging_unittest_base.cell, parallel.pimager.pimager.imsize, tests.test_cleanhelper.cleanhelper_test.imsize, tests.test_sdimaging.sdimaging_unittest_base.imsize, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, parallel.pimager.pimager.phasecenter, tests.test_cleanhelper.cleanhelper_test.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.phasecenter, cleanhelper.cleanhelper.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test011 | ( | self | ) |
Test011: Bad pointingcolumn name
Definition at line 244 of file test_sdimaging.py.
References parallel.parallel_cont.imagecont.cell, parallel.pimager.pimager.cell, tests.test_cleanhelper.cleanhelper_test.cell, tests.test_sdimaging.sdimaging_unittest_base.cell, parallel.pimager.pimager.imsize, tests.test_cleanhelper.cleanhelper_test.imsize, tests.test_sdimaging.sdimaging_unittest_base.imsize, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, parallel.pimager.pimager.phasecenter, tests.test_cleanhelper.cleanhelper_test.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.phasecenter, cleanhelper.cleanhelper.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test012 | ( | self | ) |
Test012: Bad imsize
Definition at line 250 of file test_sdimaging.py.
References parallel.parallel_cont.imagecont.cell, parallel.pimager.pimager.cell, tests.test_cleanhelper.cleanhelper_test.cell, tests.test_sdimaging.sdimaging_unittest_base.cell, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, parallel.pimager.pimager.phasecenter, tests.test_cleanhelper.cleanhelper_test.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.phasecenter, cleanhelper.cleanhelper.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test013 | ( | self | ) |
Test013: Bad cell size
Definition at line 261 of file test_sdimaging.py.
References parallel.pimager.pimager.imsize, tests.test_cleanhelper.cleanhelper_test.imsize, tests.test_sdimaging.sdimaging_unittest_base.imsize, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, parallel.pimager.pimager.phasecenter, tests.test_cleanhelper.cleanhelper_test.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.phasecenter, cleanhelper.cleanhelper.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
| def tests.test_sdimaging.sdimaging_test0.test014 | ( | self | ) |
Test014: Too fine resolution (smaller than original channel width
Definition at line 267 of file test_sdimaging.py.
References parallel.parallel_cont.imagecont.cell, parallel.pimager.pimager.cell, tests.test_cleanhelper.cleanhelper_test.cell, tests.test_sdimaging.sdimaging_unittest_base.cell, tests.test_sdimaging.sdimaging_unittest_base.gridfunction, parallel.pimager.pimager.imsize, tests.test_cleanhelper.cleanhelper_test.imsize, tests.test_sdimaging.sdimaging_unittest_base.imsize, asap.asapgrid.asapgrid_base.outfile, tests.test_sdgrid.sdgrid_unittest_base.outfile, task_sdtpimaging.sdtpimaging_worker.outfile, task_sdimprocess.sdimprocess_worker.outfile, tests.test_msmoments.msmoments_test0.outfile, tests.test_sdimaging.sdimaging_test0.outfile, tests.test_msmoments.msmoments_test1.outfile, tests.test_sdcal.sdcal_test0.outfile, asap.asapgrid.asapgrid.outfile, asap.asapgrid._SDGridPlotter.outfile, tests.test_immath.immath_test2.outfile, parallel.pimager.pimager.phasecenter, tests.test_cleanhelper.cleanhelper_test.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.phasecenter, cleanhelper.cleanhelper.phasecenter, tests.test_sdimaging.sdimaging_unittest_base.rawfile, tests.test_msmoments.msmoments_test0.rawfile, tests.test_sdgrid.sdgrid_failure_case.rawfile, tests.test_sdgrid.sdgrid_single_integ.rawfile, tests.test_msmoments.msmoments_test1.rawfile, tests.test_sdcal.sdcal_test0.rawfile, tests.test_sdgrid.sdgrid_clipping.rawfile, tests.test_sdcal.sdcal_test1.rawfile, tests.test_sdgrid.sdgrid_flagging.rawfile, tests.test_sdcal.sdcal_test2.rawfile, tests.test_sdcal.sdcal_test3.rawfile, tests.test_sdgrid.sdgrid_weighting.rawfile, tests.test_sdcal.sdcal_test4.rawfile, tests.test_sdcal.sdcal_test5.rawfile, tests.test_sdcal.sdcal_test6.rawfile, tests.test_sdgrid.sdgrid_map.rawfile, tests.test_sdcal.sdcal_test7.rawfile, tests.test_sdgrid.sdgrid_dec_correction.rawfile, tests.test_sdcal.sdcal_test8.rawfile, tests.test_sdgrid.sdgrid_grid_center.rawfile, tests.test_sdcal.sdcal_test9.rawfile, tests.test_sdcal.sdcal_test_edgemarker_generic.rawfile, and tests.test_sdcal.sdcal_test_edgemarker_raster.rawfile.
int tests.test_sdimaging.sdimaging_test0.badid [static] |
Definition at line 124 of file test_sdimaging.py.
Referenced by tests.test_sdimaging.sdimaging_test0.test002(), tests.test_sdimaging.sdimaging_test0.test003(), tests.test_sdimaging.sdimaging_test0.test004(), tests.test_sdimaging.sdimaging_test0.test007(), and tests.test_sdplot.sdplot_errorTest.test_badSelection().
Definition at line 125 of file test_sdimaging.py.
Referenced by task_sdfit.sdfit_worker.__store_fit(), task_sdlist.sdlist_worker.execute(), task_sdimaging.sdimaging_worker.execute(), task_sdflag.sdflag_worker.parameter_check(), task_sdimaging.sdimaging_worker.parameter_check(), task_sdplot.sdplot_worker.plot_azel(), task_sdplot.sdplot_worker.plot_pointing(), task_sdscale.sdscale_worker.save(), task_sdsave.sdsave_worker.save(), task_sdfit.sdfit_worker.save(), task_sdplot.sdplot_worker.save(), task_sdstat.sdstat_worker.save(), task_sdmath.sdmath_worker.save(), tests.test_sdsave.sdsave_test0.test001(), tests.test_sdimaging.sdimaging_test0.test001(), tests.test_sdscale.sdscale_test0.test001(), tests.test_sdmath.sdmath_test0.test001(), tests.test_sdimaging.sdimaging_test0.test002(), tests.test_sdsave.sdsave_test0.test002(), tests.test_sdscale.sdscale_test0.test002(), tests.test_sdmath.sdmath_test0.test002(), tests.test_sdimaging.sdimaging_test0.test003(), tests.test_sdscale.sdscale_test0.test003(), tests.test_sdmath.sdmath_test0.test003(), tests.test_sdimaging.sdimaging_test0.test004(), tests.test_sdmath.sdmath_test0.test004(), tests.test_sdimprocess.sdimprocess_test0.test005(), tests.test_sdimaging.sdimaging_test0.test005(), tests.test_sdmath.sdmath_test0.test005(), tests.test_sdimprocess.sdimprocess_test0.test006(), tests.test_sdimaging.sdimaging_test0.test006(), tests.test_sdmath.sdmath_test0.test006(), tests.test_sdimaging.sdimaging_test0.test007(), tests.test_sdmath.sdmath_test0.test007(), tests.test_sdimaging.sdimaging_test0.test008(), tests.test_sdmath.sdmath_test0.test008(), tests.test_sdimaging.sdimaging_test0.test009(), tests.test_sdimaging.sdimaging_test0.test010(), tests.test_sdimaging.sdimaging_test0.test011(), tests.test_sdimaging.sdimaging_test0.test012(), tests.test_sdimaging.sdimaging_test0.test013(), tests.test_sdimaging.sdimaging_test0.test014(), tests.test_sdimprocess.sdimprocess_test1.test100(), tests.test_sdscale.sdscale_test1.test100(), tests.test_sdimaging.sdimaging_test1.test100(), tests.test_sdmath.sdmath_test1.test100(), tests.test_sdimprocess.sdimprocess_test1.test101(), tests.test_sdscale.sdscale_test1.test101(), tests.test_sdimaging.sdimaging_test1.test101(), tests.test_sdmath.sdmath_test1.test101(), tests.test_sdscale.sdscale_test1.test102(), tests.test_sdmath.sdmath_test1.test102(), tests.test_sdscale.sdscale_test1.test103(), tests.test_sdmath.sdmath_test1.test103(), tests.test_sdscale.sdscale_test1.test104(), tests.test_sdmath.sdmath_test1.test104(), tests.test_sdscale.sdscale_test1.test105(), tests.test_sdmath.sdmath_test1.test105(), tests.test_sdscale.sdscale_test1.test106(), tests.test_sdmath.sdmath_test1.test106(), tests.test_sdscale.sdscale_test1.test107(), tests.test_sdmath.sdmath_test1.test107(), tests.test_sdmath.sdmath_test1.test108(), tests.test_sdmath.sdmath_test1.test109(), tests.test_sdmath.sdmath_test1.test110(), tests.test_sdmath.sdmath_test1.test111(), tests.test_sdmath.sdmath_test1.test112(), tests.test_sdmath.sdmath_test1.test113(), tests.test_sdmath.sdmath_test1.test114(), tests.test_sdmath.sdmath_test1.test115(), tests.test_sdscale.sdscale_test2.test200(), tests.test_sdimaging.sdimaging_test2.test200(), tests.test_sdmath.sdmath_test2.test200(), tests.test_sdimprocess.sdimprocess_test2.test2000(), tests.test_sdimprocess.sdimprocess_test2.test2001(), tests.test_sdscale.sdscale_test2.test201(), tests.test_sdimaging.sdimaging_test2.test201(), tests.test_sdmath.sdmath_test2.test201(), tests.test_sdscale.sdscale_test2.test202(), tests.test_sdmath.sdmath_test2.test202(), tests.test_sdimaging.sdimaging_test2.test202(), tests.test_sdscale.sdscale_test2.test203(), tests.test_sdmath.sdmath_test2.test203(), tests.test_sdscale.sdscale_test2.test204(), tests.test_sdscale.sdscale_test2.test205(), tests.test_sdscale.sdscale_test2.test206(), tests.test_sdscale.sdscale_test2.test207(), tests.test_sdscale.sdscale_test3.test300(), tests.test_sdimaging.sdimaging_test3.test300(), tests.test_sdmath.sdmath_test3.test300(), tests.test_sdscale.sdscale_test3.test301(), tests.test_sdimaging.sdimaging_test3.test301(), tests.test_sdmath.sdmath_test3.test301(), tests.test_sdscale.sdscale_test3.test302(), tests.test_sdmath.sdmath_test3.test302(), tests.test_sdimaging.sdimaging_test3.test302(), tests.test_sdscale.sdscale_test3.test303(), tests.test_sdmath.sdmath_test3.test303(), tests.test_sdscale.sdscale_test3.test304(), tests.test_sdscale.sdscale_test3.test305(), tests.test_sdscale.sdscale_test3.test306(), tests.test_sdscale.sdscale_test3.test307(), tests.test_sdscale.sdscale_test4.test400(), tests.test_sdscale.sdscale_test4.test401(), tests.test_sdscale.sdscale_test4.test402(), tests.test_sdscale.sdscale_test4.test403(), tests.test_sdscale.sdscale_test4.test404(), tests.test_sdscale.sdscale_test4.test405(), tests.test_sdscale.sdscale_test4.test406(), tests.test_sdscale.sdscale_test4.test407(), and tests.test_sdplot.sdplot_errorTest.test_overwrite().
string tests.test_sdimaging.sdimaging_test0.prefix [static] |
Definition at line 123 of file test_sdimaging.py.
Referenced by tests.test_sdtpimaging.sdtpimaging_test0.tearDown(), tests.test_sdimprocess.sdimprocess_test0.tearDown(), tests.test_sdsave.sdsave_test0.tearDown(), tests.test_sdimaging.sdimaging_test0.tearDown(), tests.test_sdscale.sdscale_test0.tearDown(), tests.test_sdmath.sdmath_test0.tearDown(), tests.test_sdtpimaging.sdtpimaging_test1.tearDown(), tests.test_sdimprocess.sdimprocess_test1.tearDown(), tests.test_sdsave.sdsave_test1.tearDown(), tests.test_sdscale.sdscale_test1.tearDown(), tests.test_sdtpimaging.sdtpimaging_test2.tearDown(), tests.test_sdsave.sdsave_test2.tearDown(), tests.test_sdimprocess.sdimprocess_test2.tearDown(), tests.test_sdimaging.sdimaging_test1.tearDown(), tests.test_sdscale.sdscale_test2.tearDown(), tests.test_sdmath.sdmath_test1.tearDown(), tests.test_sdsave.sdsave_test3.tearDown(), tests.test_sdsave.sdsave_test4.tearDown(), tests.test_sdscale.sdscale_test3.tearDown(), tests.test_sdsave.sdsave_test5.tearDown(), tests.test_sdsave.sdsave_test6.tearDown(), tests.test_sdimaging.sdimaging_test2.tearDown(), tests.test_sdscale.sdscale_test4.tearDown(), tests.test_sdmath.sdmath_test2.tearDown(), tests.test_sdimaging.sdimaging_test3.tearDown(), tests.test_sdmath.sdmath_test3.tearDown(), tests.test_sdimaging.sdimaging_test0.test002(), tests.test_sdmath.sdmath_test0.test007(), and tests.test_sdmath.sdmath_test0.test008().
1.8.0
