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casa
$Rev:20696$
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casa
$Rev:20696$
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Public Member Functions | |
| def | setUp |
| def | tearDown |
| def | test701 |
| def | test702 |
| def | test703 |
| def | test704 |
| def | test711 |
| def | test712 |
| def | test713 |
| def | test714 |
| def | test715 |
| def | test721 |
| def | test722 |
| def | test723 |
| def | test724 |
| def | test725 |
| def | test731 |
| def | test732 |
| def | test733 |
Static Public Attributes | |
| string | infile |
| string | outname |
| list | iflist |
| list | frf |
| list | irf |
| list | qurf |
| list | qrf |
| list | drf |
| list | badq |
Private Member Functions | |
| def | _check_restfreq |
Unit tests for task sdsave. Test scantable available restfreq
The list of tests:
test701-704 --- a value (float, int, quantity w/ and w/o a unit)
test711-715 --- a list [length=1]
(float, int, quantity w/ and w/o a unit, dict)
test721-725 --- a list [length>1]
(float, int, quantity w/ and w/o a unit, dict)
test731-733 --- a bad quantity unit (a value, a list)
Definition at line 614 of file test_sdsave.py.
| def tests.test_sdsave.sdsave_test7._check_restfreq | ( | self, | |
| outfile, | |||
| restfreq, | |||
| iflist | |||
| ) | [private] |
Definition at line 652 of file test_sdsave.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._checkfile(), tests.test_sdimprocess.sdimprocess_unittest_base._checkfile(), tests.test_sdmath.sdmath_unittest_base._checkfile(), tests.test_sdcal.sdcal_unittest_base._checkfile(), tests.test_sdsave.sdsave_unittest_base._checkfile(), and tests.test_sdimaging.sdimaging_unittest_base._checkfile().
Referenced by tests.test_sdsave.sdsave_test7.test701(), tests.test_sdsave.sdsave_test7.test702(), tests.test_sdsave.sdsave_test7.test703(), tests.test_sdsave.sdsave_test7.test704(), tests.test_sdsave.sdsave_test7.test711(), tests.test_sdsave.sdsave_test7.test712(), tests.test_sdsave.sdsave_test7.test713(), tests.test_sdsave.sdsave_test7.test714(), tests.test_sdsave.sdsave_test7.test715(), tests.test_sdsave.sdsave_test7.test721(), tests.test_sdsave.sdsave_test7.test722(), tests.test_sdsave.sdsave_test7.test723(), tests.test_sdsave.sdsave_test7.test724(), and tests.test_sdsave.sdsave_test7.test725().
| def tests.test_sdsave.sdsave_test7.setUp | ( | self | ) |
Definition at line 638 of file test_sdsave.py.
References tests.test_plotuv.plotuv_test.datapath, tests.test_sdcoadd.sdcoadd_unittest_base.datapath, tests.test_sdbaseline.sdbaseline_unittest_base.datapath, tests.test_sdplot.sdplot_unittest_base.datapath, tests.test_sdlist.sdlist_test.datapath, tests.test_sdflagmanager.sdflagmanager_test.datapath, tests.test_sdgrid.sdgrid_unittest_base.datapath, tests.test_msmoments.msmoments_unittest_base.datapath, tests.test_sdflag.sdflag_test.datapath, tests.test_sdimprocess.sdimprocess_unittest_base.datapath, tests.test_sdmath.sdmath_unittest_base.datapath, tests.test_sdsave.sdsave_unittest_base.datapath, tests.test_sdcal.sdcal_unittest_base.datapath, tests.test_sdreduce.sdreduce_test.datapath, tests.test_imstat.imstat_test.datapath, tests.test_sdfit.sdfit_test.datapath, tests.test_cleanhelper.cleanhelper_test.datapath, tests.test_sdimaging.sdimaging_unittest_base.datapath, tests.test_imsmooth.imsmooth_test.datapath, tests.test_sdcoadd.sdcoadd_mergeTest.datapath, tests.test_sdfit.sdfit_test_exceptions.datapath, tests.test_sdbaseline.sdbaseline_funcTest.datapath, casa_in_py.default(), asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, and tests.test_sdplot.sdplot_selectTest.infile.
| def tests.test_sdsave.sdsave_test7.tearDown | ( | self | ) |
Definition at line 646 of file test_sdsave.py.
References asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, and tests.test_sdplot.sdplot_selectTest.infile.
| def tests.test_sdsave.sdsave_test7.test701 | ( | self | ) |
Test 701: restfreq (a float value)
Definition at line 680 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), tests.test_sdsave.sdsave_test7.frf, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test702 | ( | self | ) |
Test 702: restfreq (an int value)
Definition at line 698 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdsave.sdsave_test7.irf, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test703 | ( | self | ) |
Test 703: restfreq (a quantity with unit)
Definition at line 716 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, tests.test_sdsave.sdsave_test7.outname, and tests.test_sdsave.sdsave_test7.qurf.
| def tests.test_sdsave.sdsave_test7.test704 | ( | self | ) |
Test 704: restfreq (a quantity withOUT unit)
Definition at line 734 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, tests.test_sdsave.sdsave_test7.outname, and tests.test_sdsave.sdsave_test7.qrf.
| def tests.test_sdsave.sdsave_test7.test711 | ( | self | ) |
Test 711: restfreq (a list of float value [length = 1])
Definition at line 752 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), tests.test_sdsave.sdsave_test7.frf, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test712 | ( | self | ) |
Test 712: restfreq (a list of int value [length = 1])
Definition at line 770 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdsave.sdsave_test7.irf, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test713 | ( | self | ) |
Test 713: restfreq (a list of quantity with unit [length = 1])
Definition at line 788 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, tests.test_sdsave.sdsave_test7.outname, and tests.test_sdsave.sdsave_test7.qurf.
| def tests.test_sdsave.sdsave_test7.test714 | ( | self | ) |
Test 714: restfreq (a list of quantity withOUT unit [length = 1])
Definition at line 806 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, tests.test_sdsave.sdsave_test7.outname, and tests.test_sdsave.sdsave_test7.qrf.
| def tests.test_sdsave.sdsave_test7.test715 | ( | self | ) |
Test 715: restfreq (a list of dictionary [length = 1])
Definition at line 824 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), tests.test_sdsave.sdsave_test7.drf, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test721 | ( | self | ) |
Test 721: restfreq (a list of float value [length > 1])
Definition at line 842 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), tests.test_sdsave.sdsave_test7.frf, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test722 | ( | self | ) |
Test 722: restfreq (a list of int value [length > 1])
Definition at line 860 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdsave.sdsave_test7.irf, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test723 | ( | self | ) |
Test 723: restfreq (a list of quantity with unit [length > 1])
Definition at line 878 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, tests.test_sdsave.sdsave_test7.outname, and tests.test_sdsave.sdsave_test7.qurf.
| def tests.test_sdsave.sdsave_test7.test724 | ( | self | ) |
Test 724: restfreq (a list of quantity withOUT unit [length > 1])
Definition at line 896 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, tests.test_sdsave.sdsave_test7.outname, and tests.test_sdsave.sdsave_test7.qrf.
| def tests.test_sdsave.sdsave_test7.test725 | ( | self | ) |
Test 725: restfreq (a list of dictionary [length > 1])
Definition at line 914 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7._check_restfreq(), tests.test_sdsave.sdsave_test7.drf, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test731 | ( | self | ) |
Test 731: restfreq (a BAD quantity unit)
Definition at line 932 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7.badq, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test732 | ( | self | ) |
Test 732: restfreq (a list of BAD quantity unit [length = 1])
Definition at line 952 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7.badq, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
| def tests.test_sdsave.sdsave_test7.test733 | ( | self | ) |
Test 733: restfreq (a list of BAD quantity unit [length > 1])
Definition at line 973 of file test_sdsave.py.
References tests.test_sdsave.sdsave_test7.badq, task_sdplot.sdplot_worker.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, task_sdgrid.sdgrid_worker.outname, tests.test_sdcoadd.sdcoadd_basicTest.outname, tests.test_sdcoadd.sdcoadd_mergeTest.outname, tests.test_sdcoadd.sdcoadd_storageTest.outname, and tests.test_sdsave.sdsave_test7.outname.
list tests.test_sdsave.sdsave_test7.badq [static] |
Definition at line 636 of file test_sdsave.py.
Referenced by tests.test_sdsave.sdsave_test7.test731(), tests.test_sdsave.sdsave_test7.test732(), and tests.test_sdsave.sdsave_test7.test733().
list tests.test_sdsave.sdsave_test7.drf [static] |
Definition at line 634 of file test_sdsave.py.
Referenced by tests.test_sdsave.sdsave_test7.test715(), tests.test_sdsave.sdsave_test7.test725(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
list tests.test_sdsave.sdsave_test7.frf [static] |
list tests.test_sdsave.sdsave_test7.iflist [static] |
Definition at line 629 of file test_sdsave.py.
Referenced by tests.test_sdsave.sdsave_test7.test701(), tests.test_sdsave.sdsave_test7.test702(), tests.test_sdsave.sdsave_test7.test703(), tests.test_sdsave.sdsave_test7.test704(), tests.test_sdsave.sdsave_test7.test711(), tests.test_sdsave.sdsave_test7.test712(), tests.test_sdsave.sdsave_test7.test713(), tests.test_sdsave.sdsave_test7.test714(), tests.test_sdsave.sdsave_test7.test715(), tests.test_sdsave.sdsave_test7.test721(), tests.test_sdsave.sdsave_test7.test722(), tests.test_sdsave.sdsave_test7.test723(), tests.test_sdsave.sdsave_test7.test724(), tests.test_sdsave.sdsave_test7.test725(), tests.test_sdsave.sdsave_test7.test731(), tests.test_sdsave.sdsave_test7.test732(), tests.test_sdsave.sdsave_test7.test733(), tests.test_sdsave.sdsave_storageTest.testDF(), tests.test_sdsave.sdsave_storageTest.testDT(), tests.test_sdsave.sdsave_storageTest.testMF(), tests.test_sdsave.sdsave_storageTest.testMT(), tests.test_sdstat.sdstat_restfreqTest.testRF01(), tests.test_sdstat.sdstat_restfreqTest.testRF02(), tests.test_sdstat.sdstat_restfreqTest.testRF11(), tests.test_sdstat.sdstat_restfreqTest.testRF12(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), tests.test_sdstat.sdstat_restfreqTest.testRF21(), tests.test_sdstat.sdstat_restfreqTest.testRF22(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
string tests.test_sdsave.sdsave_test7.infile [static] |
Definition at line 627 of file test_sdsave.py.
Referenced by task_sdtpimaging.sdtpimaging_worker.__backup(), task_sdtpimaging.sdtpimaging_worker.__execute_baseline(), task_sdtpimaging.sdtpimaging_worker.__execute_flag(), task_sdtpimaging.sdtpimaging_worker.__execute_imaging(), task_sdscale.sdscale_worker.__get_outform(), task_sdsave.sdsave_worker.cleanup(), task_sdimaging.sdimaging_worker.execute(), sdutil.sdtask_template.initialize(), sdutil.sdtask_template_imaging.initialize(), task_sdsmooth.sdsmooth_worker.initialize_scan(), task_sdplot.sdplot_worker.initialize_scan(), task_sdcal.sdcal_worker.initialize_scan(), task_sdfit.sdfit_worker.initialize_scan(), task_sdbaseline.sdbaseline_worker.initialize_scan(), task_sdstat.sdstat_worker.initialize_scan(), task_sdflag.sdflag_worker.initialize_scan(), task_sdtpimaging.sdtpimaging_worker.parameter_check(), tests.test_sdsmooth.sdsmooth_basicTest.setUp(), tests.test_sdstat.sdstat_basicTest.setUp(), tests.test_sdstat.sdstat_restfreqTest.setUp(), tests.test_sdsmooth.sdsmooth_storageTest.setUp(), tests.test_sdsave.sdsave_test7.setUp(), tests.test_sdstat.sdstat_storageTest.setUp(), tests.test_sdstat.sdstat_exceptions.setUp(), tests.test_sdsave.sdsave_storageTest.setUp(), tests.test_sdtpimaging.sdtpimaging_test0.tearDown(), tests.test_sdsmooth.sdsmooth_basicTest.tearDown(), tests.test_sdtpimaging.sdtpimaging_test1.tearDown(), tests.test_sdtpimaging.sdtpimaging_test2.tearDown(), tests.test_sdstat.sdstat_basicTest.tearDown(), tests.test_sdstat.sdstat_restfreqTest.tearDown(), tests.test_sdsmooth.sdsmooth_storageTest.tearDown(), tests.test_sdsave.sdsave_test7.tearDown(), tests.test_sdstat.sdstat_storageTest.tearDown(), tests.test_sdstat.sdstat_exceptions.tearDown(), tests.test_sdsave.sdsave_storageTest.tearDown(), tests.test_sdtpimaging.sdtpimaging_test0.test001(), tests.test_sdtpimaging.sdtpimaging_test0.test002(), tests.test_sdtpimaging.sdtpimaging_test0.test003(), tests.test_sdtpimaging.sdtpimaging_test0.test004(), tests.test_sdtpimaging.sdtpimaging_test0.test006(), tests.test_sdtpimaging.sdtpimaging_test0.test007(), tests.test_sdtpimaging.sdtpimaging_test0.test008(), tests.test_sdtpimaging.sdtpimaging_test0.test009(), tests.test_sdsmooth.sdsmooth_basicTest.test01(), tests.test_sdstat.sdstat_basicTest.test01(), tests.test_sdsmooth.sdsmooth_basicTest.test02(), tests.test_sdstat.sdstat_basicTest.test02(), tests.test_sdsmooth.sdsmooth_basicTest.test03(), tests.test_sdstat.sdstat_basicTest.test03(), tests.test_sdsmooth.sdsmooth_basicTest.test04(), tests.test_sdstat.sdstat_basicTest.test04(), tests.test_sdsmooth.sdsmooth_basicTest.test05(), tests.test_sdstat.sdstat_basicTest.test05(), tests.test_sdsmooth.sdsmooth_basicTest.test06(), tests.test_sdstat.sdstat_basicTest.test06(), tests.test_sdsmooth.sdsmooth_basicTest.test07(), tests.test_sdstat.sdstat_basicTest.test07(), tests.test_sdsmooth.sdsmooth_basicTest.test08(), tests.test_sdstat.sdstat_basicTest.test08(), tests.test_sdsmooth.sdsmooth_basicTest.test09(), tests.test_sdstat.sdstat_basicTest.test09(), tests.test_sdstat.sdstat_basicTest.test10(), tests.test_sdsmooth.sdsmooth_basicTest.test10(), tests.test_sdtpimaging.sdtpimaging_test1.test100(), tests.test_sdstat.sdstat_basicTest.test11(), tests.test_sdsmooth.sdsmooth_basicTest.test11(), tests.test_sdsmooth.sdsmooth_basicTest.test12(), tests.test_sdtpimaging.sdtpimaging_test2.test200(), tests.test_sdsave.sdsave_test7.test701(), tests.test_sdsave.sdsave_test7.test702(), tests.test_sdsave.sdsave_test7.test703(), tests.test_sdsave.sdsave_test7.test704(), tests.test_sdsave.sdsave_test7.test711(), tests.test_sdsave.sdsave_test7.test712(), tests.test_sdsave.sdsave_test7.test713(), tests.test_sdsave.sdsave_test7.test714(), tests.test_sdsave.sdsave_test7.test715(), tests.test_sdsave.sdsave_test7.test721(), tests.test_sdsave.sdsave_test7.test722(), tests.test_sdsave.sdsave_test7.test723(), tests.test_sdsave.sdsave_test7.test724(), tests.test_sdsave.sdsave_test7.test725(), tests.test_sdsave.sdsave_test7.test731(), tests.test_sdsave.sdsave_test7.test732(), tests.test_sdsave.sdsave_test7.test733(), tests.test_sdstat.sdstat_storageTest.testDF(), tests.test_sdsave.sdsave_storageTest.testDF(), tests.test_sdsmooth.sdsmooth_storageTest.testDFrg(), tests.test_sdsmooth.sdsmooth_storageTest.testDFsm(), tests.test_sdstat.sdstat_storageTest.testDT(), tests.test_sdsave.sdsave_storageTest.testDT(), tests.test_sdsmooth.sdsmooth_storageTest.testDTrg(), tests.test_sdsmooth.sdsmooth_storageTest.testDTsm(), tests.test_sdstat.sdstat_storageTest.testMF(), tests.test_sdsave.sdsave_storageTest.testMF(), tests.test_sdsmooth.sdsmooth_storageTest.testMFrg(), tests.test_sdsmooth.sdsmooth_storageTest.testMFsm(), tests.test_sdstat.sdstat_storageTest.testMT(), tests.test_sdsave.sdsave_storageTest.testMT(), tests.test_sdsmooth.sdsmooth_storageTest.testMTrg(), tests.test_sdsmooth.sdsmooth_storageTest.testMTsm(), tests.test_sdstat.sdstat_exceptions.testNoData(), tests.test_sdstat.sdstat_restfreqTest.testRF01(), tests.test_sdstat.sdstat_restfreqTest.testRF02(), tests.test_sdstat.sdstat_restfreqTest.testRF11(), tests.test_sdstat.sdstat_restfreqTest.testRF12(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), tests.test_sdstat.sdstat_restfreqTest.testRF21(), tests.test_sdstat.sdstat_restfreqTest.testRF22(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
list tests.test_sdsave.sdsave_test7.irf [static] |
string tests.test_sdsave.sdsave_test7.outname [static] |
Definition at line 628 of file test_sdsave.py.
Referenced by tests.test_sdsmooth.sdsmooth_badinputs.setUp(), tests.test_sdsave.sdsave_test7.test701(), tests.test_sdsave.sdsave_test7.test702(), tests.test_sdsave.sdsave_test7.test703(), tests.test_sdsave.sdsave_test7.test704(), tests.test_sdsave.sdsave_test7.test711(), tests.test_sdsave.sdsave_test7.test712(), tests.test_sdsave.sdsave_test7.test713(), tests.test_sdsave.sdsave_test7.test714(), tests.test_sdsave.sdsave_test7.test715(), tests.test_sdsave.sdsave_test7.test721(), tests.test_sdsave.sdsave_test7.test722(), tests.test_sdsave.sdsave_test7.test723(), tests.test_sdsave.sdsave_test7.test724(), tests.test_sdsave.sdsave_test7.test725(), tests.test_sdsave.sdsave_test7.test731(), tests.test_sdsave.sdsave_test7.test732(), tests.test_sdsave.sdsave_test7.test733(), tests.test_sdsmooth.sdsmooth_badinputs.testBad_chanwidth(), tests.test_sdsmooth.sdsmooth_badinputs.testBad_kernel(), tests.test_sdsave.sdsave_storageTest.testDF(), tests.test_sdsave.sdsave_storageTest.testDT(), tests.test_sdsave.sdsave_storageTest.testMF(), and tests.test_sdsave.sdsave_storageTest.testMT().
list tests.test_sdsave.sdsave_test7.qrf [static] |
list tests.test_sdsave.sdsave_test7.qurf [static] |
1.8.0