|
casa
$Rev:20696$
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casa
$Rev:20696$
|
Public Member Functions | |
| def | setUp |
| Actual test scripts ###. | |
| def | tearDown |
| def | test00 |
| def | test01 |
| def | test02 |
| def | test03 |
| def | test04 |
| def | test05 |
| def | test06 |
| def | test07 |
| def | test08 |
| def | test09 |
| def | test10 |
| def | test11 |
Static Public Attributes | |
| list | linechan0 |
| TODO: | |
| list | linechan2 |
| dictionary | ref_allK |
| Reference data (from ASAP r2084 + CASA r14498, Mar. | |
| dictionary | ref_allJy |
| dictionary | minmaxchan_all |
| dictionary | minmaxfreq_all |
| dictionary | minmaxvelo_all |
| dictionary | ref_line2 |
| dictionary | minmaxchan_line2 |
| dictionary | ref_bl0 |
| dictionary | minmaxchan_bl0 |
Basic unit tests for task sdstat. No interactive testing.
The list of tests:
test00 --- default parameters (raises an errror)
test01 --- default + valid input filename
test02-03 --- available fluxunits
test04-06 --- available specunits
test07-09 --- masklist in various specunit
test10 --- invertmask=True
test11 --- format
Note: input data is generated from a single dish regression data,
'OrionS_rawACSmod', as follows:
default(sdcal)
sdcal(infile='OrionS_rawACSmod',scanlist=[20,21,22,23],
calmode='ps',tau=0.09,outfile='temp.asap')
default(sdcal)
sdcal(infile='temp.asap',timeaverage=True,tweight='tintsys',
polaverage=True,pweight='tsys',outfile=self.infile)
Definition at line 174 of file test_sdstat.py.
| def tests.test_sdstat.sdstat_basicTest.setUp | ( | self | ) |
Actual test scripts ###.
Definition at line 251 of file test_sdstat.py.
References tests.test_plotuv.plotuv_test.datapath, tests.test_sdcoadd.sdcoadd_unittest_base.datapath, tests.test_sdbaseline.sdbaseline_unittest_base.datapath, tests.test_sdstat.sdstat_unittest_base.datapath, tests.test_sdplot.sdplot_unittest_base.datapath, tests.test_sdlist.sdlist_test.datapath, tests.test_sdsmooth.sdsmooth_unittest_base.datapath, tests.test_msmoments.msmoments_unittest_base.datapath, tests.test_sdgrid.sdgrid_unittest_base.datapath, tests.test_sdflagmanager.sdflagmanager_test.datapath, tests.test_sdflag.sdflag_test.datapath, tests.test_sdimprocess.sdimprocess_unittest_base.datapath, tests.test_sdscale.sdscale_unittest_base.datapath, tests.test_sdmath.sdmath_unittest_base.datapath, tests.test_sdsave.sdsave_unittest_base.datapath, tests.test_sdcal.sdcal_unittest_base.datapath, tests.test_imstat.imstat_test.datapath, tests.test_sdreduce.sdreduce_test.datapath, tests.test_sdfit.sdfit_test.datapath, tests.test_cleanhelper.cleanhelper_test.datapath, tests.test_sdimaging.sdimaging_unittest_base.datapath, tests.test_imsmooth.imsmooth_test.datapath, tests.test_sdcoadd.sdcoadd_mergeTest.datapath, tests.test_sdfit.sdfit_test_exceptions.datapath, tests.test_sdbaseline.sdbaseline_funcTest.datapath, casa_in_py.default(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, and tests.test_sdplot.sdplot_selectTest.infile.
| def tests.test_sdstat.sdstat_basicTest.tearDown | ( | self | ) |
Definition at line 258 of file test_sdstat.py.
References asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, and tests.test_sdplot.sdplot_selectTest.infile.
| def tests.test_sdstat.sdstat_basicTest.test00 | ( | self | ) |
Test 0: Default parameters
Definition at line 262 of file test_sdstat.py.
| def tests.test_sdstat.sdstat_basicTest.test01 | ( | self | ) |
Test 1: Default parameters + valid input filename
Definition at line 267 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.minmaxchan_all, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_allK.
| def tests.test_sdstat.sdstat_basicTest.test02 | ( | self | ) |
Test 2: fluxunit='K'
Definition at line 282 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.minmaxchan_all, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_allK.
| def tests.test_sdstat.sdstat_basicTest.test03 | ( | self | ) |
Test 3: fluxunit='Jy'
Definition at line 300 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.minmaxchan_all, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_allJy.
| def tests.test_sdstat.sdstat_basicTest.test04 | ( | self | ) |
Test 4: specunit='channel'
Definition at line 318 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.minmaxchan_all, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_allK.
| def tests.test_sdstat.sdstat_basicTest.test05 | ( | self | ) |
Test 5: specunit='GHz'
Definition at line 334 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.minmaxfreq_all, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_allK.
| def tests.test_sdstat.sdstat_basicTest.test06 | ( | self | ) |
Test 6: specunit='km/s'
Definition at line 350 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.minmaxvelo_all, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_allK.
| def tests.test_sdstat.sdstat_basicTest.test07 | ( | self | ) |
Test 7: maskllist (line) in specunit='channel'
Definition at line 366 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.linechan2, tests.test_sdstat.sdstat_basicTest.minmaxchan_line2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_line2.
| def tests.test_sdstat.sdstat_basicTest.test08 | ( | self | ) |
Test 8: maskllist (line) in specunit='GHz'
Definition at line 386 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._convert_masklist(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.linechan2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_line2.
| def tests.test_sdstat.sdstat_basicTest.test09 | ( | self | ) |
Test 9: maskllist (line) in specunit='km/s'
Definition at line 404 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._convert_masklist(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.linechan2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_line2.
| def tests.test_sdstat.sdstat_basicTest.test10 | ( | self | ) |
Test 10: invert = True
Definition at line 422 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_basicTest.linechan0, tests.test_sdstat.sdstat_basicTest.minmaxchan_bl0, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_basicTest.ref_bl0.
| def tests.test_sdstat.sdstat_basicTest.test11 | ( | self | ) |
Test1: specify format
Definition at line 442 of file test_sdstat.py.
References tests.test_sdstat.sdstat_unittest_base._compareFiles(), tests.test_plotuv.plotuv_test.datapath, tests.test_sdcoadd.sdcoadd_unittest_base.datapath, tests.test_sdbaseline.sdbaseline_unittest_base.datapath, tests.test_sdstat.sdstat_unittest_base.datapath, tests.test_sdplot.sdplot_unittest_base.datapath, tests.test_sdlist.sdlist_test.datapath, tests.test_sdsmooth.sdsmooth_unittest_base.datapath, tests.test_msmoments.msmoments_unittest_base.datapath, tests.test_sdflagmanager.sdflagmanager_test.datapath, tests.test_sdgrid.sdgrid_unittest_base.datapath, tests.test_sdimprocess.sdimprocess_unittest_base.datapath, tests.test_sdscale.sdscale_unittest_base.datapath, tests.test_sdflag.sdflag_test.datapath, tests.test_sdmath.sdmath_unittest_base.datapath, tests.test_sdsave.sdsave_unittest_base.datapath, tests.test_sdcal.sdcal_unittest_base.datapath, tests.test_imstat.imstat_test.datapath, tests.test_sdreduce.sdreduce_test.datapath, tests.test_sdfit.sdfit_test.datapath, tests.test_cleanhelper.cleanhelper_test.datapath, tests.test_sdimaging.sdimaging_unittest_base.datapath, tests.test_imsmooth.imsmooth_test.datapath, tests.test_sdcoadd.sdcoadd_mergeTest.datapath, tests.test_sdfit.sdfit_test_exceptions.datapath, tests.test_sdbaseline.sdbaseline_funcTest.datapath, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, and tests.test_sdstat.sdstat_unittest_base.outsuff.
list tests.test_sdstat.sdstat_basicTest.linechan0 [static] |
TODO:
Definition at line 202 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test10().
list tests.test_sdstat.sdstat_basicTest.linechan2 [static] |
Definition at line 203 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test07(), tests.test_sdstat.sdstat_basicTest.test08(), tests.test_sdstat.sdstat_basicTest.test09(), tests.test_sdstat.sdstat_storageTest.testDF(), tests.test_sdstat.sdstat_storageTest.testDT(), tests.test_sdstat.sdstat_storageTest.testMF(), and tests.test_sdstat.sdstat_storageTest.testMT().
dictionary tests.test_sdstat.sdstat_basicTest.minmaxchan_all [static] |
Definition at line 222 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test01(), tests.test_sdstat.sdstat_basicTest.test02(), tests.test_sdstat.sdstat_basicTest.test03(), and tests.test_sdstat.sdstat_basicTest.test04().
dictionary tests.test_sdstat.sdstat_basicTest.minmaxchan_bl0 [static] |
Definition at line 247 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test10().
dictionary tests.test_sdstat.sdstat_basicTest.minmaxchan_line2 [static] |
dictionary tests.test_sdstat.sdstat_basicTest.minmaxfreq_all [static] |
Definition at line 225 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test05().
dictionary tests.test_sdstat.sdstat_basicTest.minmaxvelo_all [static] |
Definition at line 229 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test06().
dictionary tests.test_sdstat.sdstat_basicTest.ref_allJy [static] |
Definition at line 214 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test03().
dictionary tests.test_sdstat.sdstat_basicTest.ref_allK [static] |
Reference data (from ASAP r2084 + CASA r14498, Mar.
31, 2011) Reference statistic values (masklist=[], invertmask=False)
Definition at line 206 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test01(), tests.test_sdstat.sdstat_basicTest.test02(), tests.test_sdstat.sdstat_basicTest.test04(), tests.test_sdstat.sdstat_basicTest.test05(), and tests.test_sdstat.sdstat_basicTest.test06().
dictionary tests.test_sdstat.sdstat_basicTest.ref_bl0 [static] |
Definition at line 243 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test10().
dictionary tests.test_sdstat.sdstat_basicTest.ref_line2 [static] |
Definition at line 235 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_basicTest.test07(), tests.test_sdstat.sdstat_basicTest.test08(), tests.test_sdstat.sdstat_basicTest.test09(), tests.test_sdstat.sdstat_storageTest.testDF(), tests.test_sdstat.sdstat_storageTest.testDT(), tests.test_sdstat.sdstat_storageTest.testMF(), and tests.test_sdstat.sdstat_storageTest.testMT().
1.8.0