Public Member Functions | |
def | setUp |
Actual test scripts ###. | |
def | tearDown |
def | testRF01 |
def | testRF02 |
def | testRF11 |
def | testRF12 |
def | testRF13 |
def | testRF21 |
def | testRF22 |
def | testRF23 |
Static Public Attributes | |
list | iflist |
list | frf |
list | irf |
list | qurf |
list | qrf |
list | drf |
list | badq |
dictionary | ref_allK02 |
dictionary | minmaxvrf0_all0 |
dictionary | minmaxvrf2_all0 |
dictionary | minmaxvrf2_all2 |
Unit tests for task sdstat. Test variations of restfreq parameter. The list of tests: testRF01 - testRF02 --- a value (float, quantity w/ unit) testRF11 - testRF13 --- single element list (int, quantity w/o unit, dictionary) testRF21 - testRF23 --- single element list (float/int, quantity, dictionary)
Definition at line 461 of file test_sdstat.py.
def tests.test_sdstat.sdstat_restfreqTest.setUp | ( | self | ) |
Actual test scripts ###.
Definition at line 499 of file test_sdstat.py.
References tests.test_plotuv.plotuv_test.datapath, tests.test_sdcoadd.sdcoadd_unittest_base.datapath, tests.test_sdbaseline.sdbaseline_unittest_base.datapath, tests.test_sdstat.sdstat_unittest_base.datapath, tests.test_sdplot.sdplot_unittest_base.datapath, tests.test_sdlist.sdlist_test.datapath, tests.test_sdsmooth.sdsmooth_unittest_base.datapath, tests.test_msmoments.msmoments_unittest_base.datapath, tests.test_sdgrid.sdgrid_unittest_base.datapath, tests.test_sdflagmanager.sdflagmanager_test.datapath, tests.test_sdflag.sdflag_test.datapath, tests.test_sdimprocess.sdimprocess_unittest_base.datapath, tests.test_sdscale.sdscale_unittest_base.datapath, tests.test_sdmath.sdmath_unittest_base.datapath, tests.test_sdsave.sdsave_unittest_base.datapath, tests.test_sdcal.sdcal_unittest_base.datapath, tests.test_imstat.imstat_test.datapath, tests.test_sdreduce.sdreduce_test.datapath, tests.test_sdfit.sdfit_test.datapath, tests.test_cleanhelper.cleanhelper_test.datapath, tests.test_sdimaging.sdimaging_unittest_base.datapath, tests.test_imsmooth.imsmooth_test.datapath, tests.test_sdcoadd.sdcoadd_mergeTest.datapath, tests.test_sdfit.sdfit_test_exceptions.datapath, tests.test_sdbaseline.sdbaseline_funcTest.datapath, casa_in_py.default(), asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, and tests.test_sdplot.sdplot_selectTest.infile.
def tests.test_sdstat.sdstat_restfreqTest.tearDown | ( | self | ) |
Definition at line 506 of file test_sdstat.py.
References asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, and tests.test_sdplot.sdplot_selectTest.infile.
def tests.test_sdstat.sdstat_restfreqTest.testRF01 | ( | self | ) |
Test RF01: restfreq (a float value)
Definition at line 511 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), tests.test_sdstat.sdstat_restfreqTest.frf, tests.test_sdsave.sdsave_test7.frf, task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF02 | ( | self | ) |
Test RF02: restfreq (a quantity w/ unit)
Definition at line 532 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, tests.test_sdstat.sdstat_restfreqTest.qurf, tests.test_sdsave.sdsave_test7.qurf, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF11 | ( | self | ) |
Test RF11: restfreq (single element list of int)
Definition at line 553 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.irf, tests.test_sdsave.sdsave_test7.irf, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF12 | ( | self | ) |
Test RF12: restfreq (single element list of quantity w/o unit)
Definition at line 574 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, tests.test_sdstat.sdstat_restfreqTest.qrf, tests.test_sdsave.sdsave_test7.qrf, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF13 | ( | self | ) |
Test RF13: restfreq (single element list of dictionary)
Definition at line 595 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), tests.test_sdstat.sdstat_restfreqTest.drf, tests.test_sdsave.sdsave_test7.drf, task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF21 | ( | self | ) |
Test RF21: restfreq (a list of float & int)
Definition at line 616 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), tests.test_sdstat.sdstat_restfreqTest.frf, tests.test_sdsave.sdsave_test7.frf, task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.irf, tests.test_sdsave.sdsave_test7.irf, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf0_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF22 | ( | self | ) |
Test RF22: restfreq (a list of quantity w/ and w/o unit)
Definition at line 637 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf0_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, tests.test_sdstat.sdstat_restfreqTest.qrf, tests.test_sdsave.sdsave_test7.qrf, tests.test_sdstat.sdstat_restfreqTest.qurf, tests.test_sdsave.sdsave_test7.qurf, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
def tests.test_sdstat.sdstat_restfreqTest.testRF23 | ( | self | ) |
Test RF23: restfreq (a list of dictionary)
Definition at line 658 of file test_sdstat.py.
References tests.test_sdbaseline.sdbaseline_unittest_base._compareStats(), tests.test_sdstat.sdstat_unittest_base._compareStats(), tests.test_sdstat.sdstat_restfreqTest.drf, tests.test_sdsave.sdsave_test7.drf, task_sdplot.sdplot_worker.iflist, tests.test_sdstat.sdstat_restfreqTest.iflist, tests.test_sdsave.sdsave_test7.iflist, tests.test_sdbaseline.sdbaseline_storageTest.iflist, tests.test_sdplot.sdplot_storageTest.iflist, tests.test_sdsave.sdsave_storageTest.iflist, asap.asapgrid.asapgrid_base.infile, tests.test_sdstat.sdstat_unittest_base.infile, tests.test_sdflagmanager.sdflagmanager_test.infile, tests.test_sdflag.sdflag_test.infile, task_sdgrid.sdgrid_worker.infile, tests.test_sdsave.sdsave_test0.infile, tests.test_sdsmooth.sdsmooth_basicTest.infile, tests.test_sdplot.sdplot_errorTest.infile, tests.test_sdsave.sdsave_test1.infile, tests.test_sdbaseline.sdbaseline_basicTest.infile, tests.test_sdsave.sdsave_test2.infile, asap.asapgrid.asapgrid.infile, tests.test_sdplot.sdplot_basicTest.infile, tests.test_sdbaseline.sdbaseline_maskTest.infile, tests.test_sdsave.sdsave_test3.infile, asap.asapgrid._SDGridPlotter.infile, tests.test_sdsave.sdsave_test4.infile, tests.test_sdsave.sdsave_test5.infile, tests.test_sdsave.sdsave_test6.infile, tests.test_sdsmooth.sdsmooth_storageTest.infile, tests.test_sdsave.sdsave_test7.infile, tests.test_sdbaseline.sdbaseline_multi_IF_test.infile, tests.test_sdbaseline.sdbaseline_storageTest.infile, tests.test_sdplot.sdplot_storageTest.infile, tests.test_sdsave.sdsave_storageTest.infile, tests.test_sdplot.sdplot_gridTest.infile, tests.test_sdplot.sdplot_selectTest.infile, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0, tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2, tests.test_sdstat.sdstat_unittest_base.outroot, tests.test_sdlist.sdlist_test.outroot, tests.test_sdreduce.sdreduce_test.outroot, tests.test_sdsmooth.sdsmooth_basicTest.outroot, tests.test_sdbaseline.sdbaseline_basicTest.outroot, tests.test_sdbaseline.sdbaseline_maskTest.outroot, tests.test_sdsmooth.sdsmooth_storageTest.outroot, tests.test_sdbaseline.sdbaseline_funcTest.outroot, tests.test_sdbaseline.sdbaseline_multi_IF_test.outroot, tests.test_sdbaseline.sdbaseline_storageTest.outroot, tests.test_sdstat.sdstat_unittest_base.outsuff, and tests.test_sdstat.sdstat_restfreqTest.ref_allK02.
list tests.test_sdstat.sdstat_restfreqTest.badq [static] |
Definition at line 477 of file test_sdstat.py.
list tests.test_sdstat.sdstat_restfreqTest.drf [static] |
Definition at line 475 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF13(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
list tests.test_sdstat.sdstat_restfreqTest.frf [static] |
Definition at line 471 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF01(), and tests.test_sdstat.sdstat_restfreqTest.testRF21().
list tests.test_sdstat.sdstat_restfreqTest.iflist [static] |
Definition at line 470 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF01(), tests.test_sdstat.sdstat_restfreqTest.testRF02(), tests.test_sdstat.sdstat_restfreqTest.testRF11(), tests.test_sdstat.sdstat_restfreqTest.testRF12(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), tests.test_sdstat.sdstat_restfreqTest.testRF21(), tests.test_sdstat.sdstat_restfreqTest.testRF22(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
list tests.test_sdstat.sdstat_restfreqTest.irf [static] |
Definition at line 472 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF11(), and tests.test_sdstat.sdstat_restfreqTest.testRF21().
dictionary tests.test_sdstat.sdstat_restfreqTest.minmaxvrf0_all0 [static] |
Definition at line 490 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF21(), and tests.test_sdstat.sdstat_restfreqTest.testRF22().
dictionary tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all0 [static] |
Definition at line 492 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF01(), tests.test_sdstat.sdstat_restfreqTest.testRF02(), tests.test_sdstat.sdstat_restfreqTest.testRF11(), tests.test_sdstat.sdstat_restfreqTest.testRF12(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
dictionary tests.test_sdstat.sdstat_restfreqTest.minmaxvrf2_all2 [static] |
Definition at line 494 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF01(), tests.test_sdstat.sdstat_restfreqTest.testRF02(), tests.test_sdstat.sdstat_restfreqTest.testRF11(), tests.test_sdstat.sdstat_restfreqTest.testRF12(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), tests.test_sdstat.sdstat_restfreqTest.testRF21(), tests.test_sdstat.sdstat_restfreqTest.testRF22(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().
list tests.test_sdstat.sdstat_restfreqTest.qrf [static] |
Definition at line 474 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF12(), and tests.test_sdstat.sdstat_restfreqTest.testRF22().
list tests.test_sdstat.sdstat_restfreqTest.qurf [static] |
Definition at line 473 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF02(), and tests.test_sdstat.sdstat_restfreqTest.testRF22().
dictionary tests.test_sdstat.sdstat_restfreqTest.ref_allK02 [static] |
Definition at line 482 of file test_sdstat.py.
Referenced by tests.test_sdstat.sdstat_restfreqTest.testRF01(), tests.test_sdstat.sdstat_restfreqTest.testRF02(), tests.test_sdstat.sdstat_restfreqTest.testRF11(), tests.test_sdstat.sdstat_restfreqTest.testRF12(), tests.test_sdstat.sdstat_restfreqTest.testRF13(), tests.test_sdstat.sdstat_restfreqTest.testRF21(), tests.test_sdstat.sdstat_restfreqTest.testRF22(), and tests.test_sdstat.sdstat_restfreqTest.testRF23().